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Extraction of Semiconductor Diode Parameters (Record no. 60469)

MARC details
000 -LEADER
fixed length control field 04574nam a22005655i 4500
001 - CONTROL NUMBER
control field 978-3-031-48847-4
003 - CONTROL NUMBER IDENTIFIER
control field DE-He213
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20251030112255.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 240603s2024 sz | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783031488474
-- 978-3-031-48847-4
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/978-3-031-48847-4
Source of number or code doi
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QC610.9-611.8
072 #7 - SUBJECT CATEGORY CODE
Subject category code TJFD5
Source bicssc
072 #7 - SUBJECT CATEGORY CODE
Subject category code SCI077000
Source bisacsh
072 #7 - SUBJECT CATEGORY CODE
Subject category code TJFD
Source thema
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Ocaya, Richard.
Relator term author.
Relator code aut
-- http://id.loc.gov/vocabulary/relators/aut
9 (RLIN) 78147
245 10 - TITLE STATEMENT
Title Extraction of Semiconductor Diode Parameters
Medium [electronic resource] :
Remainder of title A Comparative Review of Methods and Materials /
Statement of responsibility, etc. by Richard Ocaya.
250 ## - EDITION STATEMENT
Edition statement 1st ed. 2024.
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture Cham :
Name of producer, publisher, distributor, manufacturer Springer Nature Switzerland :
-- Imprint: Springer,
Date of production, publication, distribution, manufacture, or copyright notice 2024.
300 ## - PHYSICAL DESCRIPTION
Extent XIX, 174 p. 86 illus., 62 illus. in color.
Other physical details online resource.
336 ## - CONTENT TYPE
Content type term text
Content type code txt
Source rdacontent
337 ## - MEDIA TYPE
Media type term computer
Media type code c
Source rdamedia
338 ## - CARRIER TYPE
Carrier type term online resource
Carrier type code cr
Source rdacarrier
347 ## - DIGITAL FILE CHARACTERISTICS
File type text file
Encoding format PDF
Source rda
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Determining p-n Junction Band Gap -- Review of Metal-Semiconductor Junctions -- Contemporary Parameter Extraction Methods -- Transient Methods -- New Parameter Extraction Techniques -- p-n Diode Parameter Extraction -- Novel Unified Method -- Artifical Intelligence Parameter Extraction Methods.
520 ## - SUMMARY, ETC.
Summary, etc. This book presents a comprehensive treatise on the extraction of semiconductor diode parameters using various methods. Its focus is on metal-semiconductor, metal-insulator-semiconductor, and p-n junction diodes, covering a wide range of metals and semiconductors, including elemental, compound, organic, and nanostructured materials. By bringing together these methods in one place, this book provides a much-needed standardized point of reference for the field. The methods used for device characterization have spread widely but not yet critically compared and contrasted. This book aims to bridge this gap by offering a comparative review of the methods and providing the most accurate information on current developments. The result is a valuable resource for researchers and practitioners who seek to optimize their use of semiconductor diodes in their work. With its thorough coverage and critical analysis, this book fills a large void in the field of semiconductor device characterization. It is an essential reference for anyone interested in the extraction of semiconductor diode parameters using a variety of methods. "Extraction of Semiconductor Diode Parameters: A Comparative Review of Methods and Materials" is an invaluable resource for anyone in the field. The book brilliantly fulfills its mission to encapsulate the latest developments in semiconductor diodes, providing comprehensive coverage of various materials and crucial parameters. Its comparative analysis of extraction methods, attention to series resistance, and exploration of emerging 2D materials make it a standout in the literature. Moreover, the book's dedication to addressing the impact of artificial intelligence is commendable. As a testament to the author's commitment to empowering researchers and engineers, this book is a must-have companion for those seeking to unlock the full potential of semiconductor devices, making it an indispensable reference in this rapidly evolving field. Prof. Yakuphanoglu, Department of Physics, Faculty of Science, Firat University, Elazig, Turkey Prof. Kwadwo Mensah - Darkwa, Department of Materials Engineering, Faculty of Mechanical and Chemical Engineering, College of Engineering, Kwame Nkrumah University of Science and Technology, Kumasi - Ghana.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element
9 (RLIN) 69883
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element
9 (RLIN) 66607
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element
9 (RLIN) 66773
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element
9 (RLIN) 69883
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element
9 (RLIN) 67319
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element
9 (RLIN) 66773
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer Nature eBook
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Printed edition:
International Standard Book Number 9783031488467
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Printed edition:
International Standard Book Number 9783031488481
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Printed edition:
International Standard Book Number 9783031488498
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://doi.org/10.1007/978-3-031-48847-4">https://doi.org/10.1007/978-3-031-48847-4</a>
912 ## -
-- ZDB-2-PHA
912 ## -
-- ZDB-2-SXP

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