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Recent Advances in Microelectronics Reliability (Record no. 61522)

MARC details
000 -LEADER
fixed length control field 04370nam a22005415i 4500
001 - CONTROL NUMBER
control field 978-3-031-59361-1
003 - CONTROL NUMBER IDENTIFIER
control field DE-He213
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20251030112624.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 240712s2024 sz | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783031593611
-- 978-3-031-59361-1
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/978-3-031-59361-1
Source of number or code doi
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7867-7867.5
072 #7 - SUBJECT CATEGORY CODE
Subject category code TJFC
Source bicssc
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC008010
Source bisacsh
072 #7 - SUBJECT CATEGORY CODE
Subject category code TJFC
Source thema
245 10 - TITLE STATEMENT
Title Recent Advances in Microelectronics Reliability
Medium [electronic resource] :
Remainder of title Contributions from the European ECSEL JU project iRel40 /
Statement of responsibility, etc. edited by Willem Dirk van Driel, Klaus Pressel, Mujdat Soyturk.
250 ## - EDITION STATEMENT
Edition statement 1st ed. 2024.
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture Cham :
Name of producer, publisher, distributor, manufacturer Springer International Publishing :
-- Imprint: Springer,
Date of production, publication, distribution, manufacture, or copyright notice 2024.
300 ## - PHYSICAL DESCRIPTION
Extent XIII, 403 p. 196 illus., 171 illus. in color.
Other physical details online resource.
336 ## - CONTENT TYPE
Content type term text
Content type code txt
Source rdacontent
337 ## - MEDIA TYPE
Media type term computer
Media type code c
Source rdamedia
338 ## - CARRIER TYPE
Carrier type term online resource
Carrier type code cr
Source rdacarrier
347 ## - DIGITAL FILE CHARACTERISTICS
File type text file
Encoding format PDF
Source rda
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Chapter 1. Material characterization -- Chapter 2. Smart optical inline metrology -- Chapter 3. Automated classification of semiconductor defect density SEM images using deep learning -- Chapter 4. An Artificial Intelligence-based Framework for Burn-in Reduction in the Semiconductor Manufacturing Industry -- Chapter 5. An Artificial Intelligence-based Framework for Burn-in Reduction in the Semiconductor Manufacturing Industry -- Chapter 6. Early Lifetime Estimation for Automotive Lidar using Realistic L4 Usage Profiles -- Chapter 7. Improving the reliability of automotive sensors -- Chapter 8. Reliability improvements for in-wheel motor -- Chapter 9. Big Data Streaming and Data Analytics Infrastructure for Efficient AI-Based Processing -- Chapter 10. An Outlook on Power Electronics Reliability and Reliability Monitoring -- Chapter 11. Digital Twin Technology in Electronics -- Chapter 12. A Framework for Applying Data-driven AI/ML Models in Reliability. Chapter 13. Health monitoring fatigue properties of solder Interconnects in LED drivers -- Chapter 14. Compiling Hybrid Models for embedded architectures using TensorflowLite for Microcontrollers -- Chapter 15. Design support for reliable integrated circuits -- Chapter 16. Outlook: the future of reliability.
520 ## - SUMMARY, ETC.
Summary, etc. This book describes the latest progress in reliability analysis of microelectronic products. The content grows out of an EU project, named Intelligent Reliability 4.0 - iRel40 (see www.irel40.eu ). Different industrial sectors and topics are covered, such as electronics in automotive, rail transport, lighting and personal appliances. Several case studies and examples are discussed, which will enable readers to assess and mitigate similar failure cases. More importantly, this book tries to present methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of electronic devices. Describes state-of-the-art methodologies for analyzing the reliability, failure, and degradation of electronic devices; Discusses how to correlate electronic processing and performance to reliability and lifetime; Provides an overview of simulation techniques and methodologies to predict lifetime and reliability of electronic devices.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element
9 (RLIN) 66119
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element
9 (RLIN) 66120
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name van Driel, Willem Dirk.
Relator term editor.
Relator code edt
-- http://id.loc.gov/vocabulary/relators/edt
9 (RLIN) 80399
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Pressel, Klaus.
Relator term editor.
Relator code edt
-- http://id.loc.gov/vocabulary/relators/edt
9 (RLIN) 80400
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Soyturk, Mujdat.
Relator term editor.
Relator code edt
-- http://id.loc.gov/vocabulary/relators/edt
9 (RLIN) 80401
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer Nature eBook
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Printed edition:
International Standard Book Number 9783031593604
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Printed edition:
International Standard Book Number 9783031593628
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Printed edition:
International Standard Book Number 9783031593635
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://doi.org/10.1007/978-3-031-59361-1">https://doi.org/10.1007/978-3-031-59361-1</a>
912 ## -
-- ZDB-2-ENG
912 ## -
-- ZDB-2-SXE

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