SÇ, Joaquim P. Marques de <br/><br/>
Pattern recognition  concepts, methods and applications 
J. P. Marques de S  
 - Berlin;  Heidelberg;  New York   Springer  2001 
 - xix, 318 p. il., fig., sch., diagr., fotogr. ; 24 cm + CD-ROM 
<br/><br/><label>ISBN: </label>3-540-42297-8 
<br/><br/><label>Source: </label>C-239440 
<br/><br/><label>Index Terms--Genre/Form: </label><br/> lucrare de specialitate
<br/><br/><label>Universal Decimal Class. No.: </label>4.93