Karmakar, Arijit. creator author. aut http://id.loc.gov/vocabulary/relators/aut De Smedt, Valentijn. author. aut http://id.loc.gov/vocabulary/relators/aut Leroux, Paul. author. aut http://id.loc.gov/vocabulary/relators/aut SpringerLink (Online service) text sz 2024 1st ed. 2024. monographic eng

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access XXI, 139 p. 81 illus., 39 illus. in color. online resource. This book covers the most recent, advanced methods for designing mixed-signal integrated circuits, for radiation-hardened sensor readouts (capacitive) and frequency synthesizers (quadrature, digitally controlled oscillators and all-digital PLL etc.). The authors discuss the ionizing radiation sources, complex failure mechanisms as well as several mitigation strategies for avoiding such failures. Readers will benefit from an introduction to the essential theory and fundamentals of ionizing radiation and time-based signal processing, with the details of the implementation of several radiation-hardened IC prototypes. The radiation-hardening methods and solutions described are supported by theory and experimental data with, underlying tradeoffs. Discusses the basics of time-based signal processing and its effectiveness in mitigating ionizing radiation Provides mitigation strategies and recommendations for reducing radiation induced effects in Integrated Circuits Includes coverage of devices used in measuring radiation, focusing on semiconductor-based radiation sensors. Introduction -- Fundamentals of Ionizing Radiation -- Basics of Time-based Signal Processing -- Radiation Assessment of Quadrature LC Oscillators -- Radiation-Hardened Delta-Sigma CDC -- Multi-order Differential Delta-Sigma TDC -- Research Valorization: Radiation-hardened ADPLL -- Conclusion. by Arijit Karmakar, Valentijn De Smedt, Paul Leroux. Electronic circuit design Telecommunication Signal processing Electronics Design and Verification Microwaves, RF Engineering and Optical Communications Digital and Analog Signal Processing TK7867-7867.5 9783031406201 https://doi.org/10.1007/978-3-031-40620-1 https://doi.org/10.1007/978-3-031-40620-1 231012 20251030110821.0 978-3-031-40620-1