04684nam a22006015i 4500 978-3-031-44734-1 DE-He213 20251030111405.0 cr nn 008mamaa 240129s2024 sz | s |||| 0|eng d 9783031447341 978-3-031-44734-1 10.1007/978-3-031-44734-1 doi QA76.9.C65 UYM bicssc COM072000 bisacsh UYM thema Ubar, Raimund. author. aut http://id.loc.gov/vocabulary/relators/aut 70047 Structural Decision Diagrams in Digital Test [electronic resource] : Theory and Applications / by Raimund Ubar, Jaan Raik, Maksim Jenihhin, Artur Jutman. 1st ed. 2024. Cham : Springer Nature Switzerland : Imprint: Birkhäuser, 2024. XIII, 595 p. 318 illus., 62 illus. in color. online resource. text txt rdacontent computer c rdamedia online resource cr rdacarrier text file PDF rda Computer Science Foundations and Applied Logic, 2731-5762 Chapter 1: Introduction -- Chapter 2: Overview of structural decision diagrams -- Chapter 3: Structurally Synthesized Binary Decision Diagrams -- Chapter 4: Fault modeling in digital circuits -- Chapter 5: Logic-level fault simulation -- Chapter 6: Test generation, fault diagnosis and testability -- Chapter 7: High-Level Decision Diagrams -- Chapter 8: Test generation for microprocessors with HLDDs. This is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research. The book introduces and discusses applications of two types of structural decision diagrams (DDs): low-level, structurally synthesized binary DDs (SSBDDs) and high-level DDs (HLDDs) that enable diagnostic modeling of complex digital circuits and systems. Topics and features: Provides the definition, properties and techniques for synthesis, compression and optimization of SSBDDs and HLDDs Provides numerous working examples that illustrate the key points of the text Describes applications of SSBDDs and HLDDs for various electronic design automation (EDA) tasks, such as logic-level fault modeling and simulation, multi-valued simulation, timing-critical path identification, and test generation Discusses the advantages of the proposed model to traditional binary decision diagrams and other traditional design representations Combines SSBDDs with HLDDs for multi-level representation of digital systems for enabling hierarchical and cross-level solving of complex test-related tasks This unique book is aimed at researchers working in the fields of computer science and computer engineering, focusing on test, diagnosis and dependability of digital systems. It can also serve as a reference for graduate- and advanced undergraduate-level computer engineering and electronics courses. Three authors are affiliated with the Dept. of Computer Systems at the Tallinn University of Technology, Estonia: Raimund Ubar is a retired Professor, Jaan Raik and Maksim Jenihhin are tenured Professors. Artur Jutman, PhD, is a researcher at the same university and the CEO of TestonicaLab Ltd., Estonia. Computer simulation. Computer science. 58552 Electronic circuits. Operations research. 57943 Computer Modelling. 65738 Computer Science Logic and Foundations of Programming. 68173 Electronic Circuits and Systems. Operations Research and Decision Theory. 67143 Raik, Jaan. author. aut http://id.loc.gov/vocabulary/relators/aut 70048 Jenihhin, Maksim. author. aut http://id.loc.gov/vocabulary/relators/aut 70049 Jutman, Artur. author. aut http://id.loc.gov/vocabulary/relators/aut 70050 SpringerLink (Online service) Springer Nature eBook Printed edition: 9783031447334 Printed edition: 9783031447358 Printed edition: 9783031447365 Computer Science Foundations and Applied Logic, 2731-5762 69816 https://doi.org/10.1007/978-3-031-44734-1 ZDB-2-SCS ZDB-2-SXCS 57344 57344