04323nam a22006375i 4500 978-3-031-44233-9 DE-He213 20251030111419.0 cr nn 008mamaa 240206s2024 sz | s |||| 0|eng d 9783031442339 978-3-031-44233-9 10.1007/978-3-031-44233-9 doi T50 QC100.5-.8 PDDM bicssc TEC022000 bisacsh PDD thema Xia, Fangzhou. author. aut http://id.loc.gov/vocabulary/relators/aut 70708 Active Probe Atomic Force Microscopy [electronic resource] : A Practical Guide on Precision Instrumentation / by Fangzhou Xia, Ivo W. Rangelow, Kamal Youcef-Toumi. 1st ed. 2024. Cham : Springer International Publishing : Imprint: Springer, 2024. XXIV, 366 p. 138 illus., 125 illus. in color. online resource. text txt rdacontent computer c rdamedia online resource cr rdacarrier text file PDF rda Introduction -- Active Probe Design and Fabrication -- Advanced Applications of Active Probes -- Atomic Force Microscope Designs -- AFM System using Active Probe -- A Low-cost AFM Design for Engineering Education -- Appendix. From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatronic system topics are covered including mechanics, sensors, actuators, transmission design, system identification, signal processing, dynamic system modeling, controller. With a solid theoretical foundation, practical examples are provided for AFM subsystem level design on nano-positioning system, cantilever probe, control system and system integration. This book emphasizes novel development of active cantilever probes with embedded transducers, which enables new AFM capabilities for advanced applications. Full design details of a low-cost educational AFM and a Scale Model Interactive Learning Extended Reality (SMILER) toolkit are provided, which helps instructors to make use of this book for curriculum development. This book aims to empower AFM users with deeper understanding of theinstrument to extend AFM functionalities for advanced state-of-the-art research studies. Going beyond AFM, materials presented in this book are widely applicable to precision mechatronic system design covered in many upper-level graduate courses in mechanical and electrical engineering to cultivate next generation instrumentalists. Presents the instrument design details of atomic force microscopy with focus on active cantilever probes; Includes examples and exercises to boost understanding of AFM subsystem design, fabrication and integration; Imparts a hands-on curriculum for precision mechatronics and instrumentation with AFM and digital twin simulators. Measurement. 67386 Measuring instruments. 67387 Electronics. 65899 Mechatronics. 68795 Spectrum analysis. 69373 Microtechnology. 65900 Microelectromechanical systems. 65901 Measurement Science and Instrumentation. 67389 Electronics and Microelectronics, Instrumentation. 65902 Mechatronics. 68795 Spectroscopy. 69375 Microsystems and MEMS. 65903 Rangelow, Ivo W. author. aut http://id.loc.gov/vocabulary/relators/aut 70709 Youcef-Toumi, Kamal. author. aut http://id.loc.gov/vocabulary/relators/aut 70710 SpringerLink (Online service) Springer Nature eBook Printed edition: 9783031442322 Printed edition: 9783031442346 Printed edition: 9783031442353 https://doi.org/10.1007/978-3-031-44233-9 ZDB-2-PHA ZDB-2-SXP 57522 57522