04367nam a22005175i 4500001001800000003000900018005001700027007001500044008004100059020003700100024003500137050001800172072001800190072002300208072001600231100008400247245014200331250001800473264006900491300006500560336002600625337002600651338003600677347002400713505030000737520228401037650002703321650002503348650002803373650001903401650002903420650002703449650002403476650002803500650003303528650002903561710003403590773002603624776003603650776003603686776003603722856004603758912001403804912001403818999001703832978-3-031-48847-4DE-He21320251030112255.0cr nn 008mamaa240603s2024    sz |    s    |||| 0|eng d  a97830314884749978-3-031-48847-47 a10.1007/978-3-031-48847-42doi 4aQC610.9-611.8 7aTJFD52bicssc 7aSCI0770002bisacsh 7aTJFD2thema1 aOcaya, Richard.eauthor.4aut4http://id.loc.gov/vocabulary/relators/aut97814710aExtraction of Semiconductor Diode Parametersh[electronic resource] :bA Comparative Review of Methods and Materials /cby Richard Ocaya.  a1st ed. 2024. 1aCham :bSpringer Nature Switzerland :bImprint: Springer,c2024.  aXIX, 174 p. 86 illus., 62 illus. in color.bonline resource.  atextbtxt2rdacontent  acomputerbc2rdamedia  aonline resourcebcr2rdacarrier  atext filebPDF2rda0 aDetermining p-n Junction Band Gap -- Review of Metal-Semiconductor Junctions -- Contemporary Parameter Extraction Methods -- Transient Methods -- New Parameter Extraction Techniques -- p-n Diode Parameter Extraction -- Novel Unified Method -- Artifical Intelligence Parameter Extraction Methods.  aThis book presents a comprehensive treatise on the extraction of semiconductor diode parameters using various methods. Its focus is on metal-semiconductor, metal-insulator-semiconductor, and p-n junction diodes, covering a wide range of metals and semiconductors, including elemental, compound, organic, and nanostructured materials. By bringing together these methods in one place, this book provides a much-needed standardized point of reference for the field. The methods used for device characterization have spread widely but not yet critically compared and contrasted. This book aims to bridge this gap by offering a comparative review of the methods and providing the most accurate information on current developments. The result is a valuable resource for researchers and practitioners who seek to optimize their use of semiconductor diodes in their work. With its thorough coverage and critical analysis, this book fills a large void in the field of semiconductor device characterization. It is an essential reference for anyone interested in the extraction of semiconductor diode parameters using a variety of methods. "Extraction of Semiconductor Diode Parameters: A Comparative Review of Methods and Materials" is an invaluable resource for anyone in the field. The book brilliantly fulfills its mission to encapsulate the latest developments in semiconductor diodes, providing comprehensive coverage of various materials and crucial parameters. Its comparative analysis of extraction methods, attention to series resistance, and exploration of emerging 2D materials make it a standout in the literature. Moreover, the book's dedication to addressing the impact of artificial intelligence is commendable. As a testament to the author's commitment to empowering researchers and engineers, this book is a must-have companion for those seeking to unlock the full potential of semiconductor devices, making it an indispensable reference in this rapidly evolving field. Prof. Yakuphanoglu, Department of Physics, Faculty of Science, Firat University, Elazig, Turkey Prof. Kwadwo Mensah - Darkwa, Department of Materials Engineering, Faculty of Mechanical and Chemical Engineering, College of Engineering, Kwame Nkrumah University of Science and Technology, Kumasi - Ghana. 0aSemiconductors.969883 0aSolid state physics. 0aOptoelectronic devices. 0aOptics.966607 0aCondensed matter.96677314aSemiconductors.96988324aElectronic Devices.24aOptoelectronic Devices.24aOptics and Photonics.96731924aCondensed Matter.9667732 aSpringerLink (Online service)0 tSpringer Nature eBook08iPrinted edition:z978303148846708iPrinted edition:z978303148848108iPrinted edition:z978303148849840uhttps://doi.org/10.1007/978-3-031-48847-4  aZDB-2-PHA  aZDB-2-SXP  c60469d60469