04370nam a22005415i 4500 978-3-031-59361-1 DE-He213 20251030112624.0 cr nn 008mamaa 240712s2024 sz | s |||| 0|eng d 9783031593611 978-3-031-59361-1 10.1007/978-3-031-59361-1 doi TK7867-7867.5 TJFC bicssc TEC008010 bisacsh TJFC thema Recent Advances in Microelectronics Reliability [electronic resource] : Contributions from the European ECSEL JU project iRel40 / edited by Willem Dirk van Driel, Klaus Pressel, Mujdat Soyturk. 1st ed. 2024. Cham : Springer International Publishing : Imprint: Springer, 2024. XIII, 403 p. 196 illus., 171 illus. in color. online resource. text txt rdacontent computer c rdamedia online resource cr rdacarrier text file PDF rda Chapter 1. Material characterization -- Chapter 2. Smart optical inline metrology -- Chapter 3. Automated classification of semiconductor defect density SEM images using deep learning -- Chapter 4. An Artificial Intelligence-based Framework for Burn-in Reduction in the Semiconductor Manufacturing Industry -- Chapter 5. An Artificial Intelligence-based Framework for Burn-in Reduction in the Semiconductor Manufacturing Industry -- Chapter 6. Early Lifetime Estimation for Automotive Lidar using Realistic L4 Usage Profiles -- Chapter 7. Improving the reliability of automotive sensors -- Chapter 8. Reliability improvements for in-wheel motor -- Chapter 9. Big Data Streaming and Data Analytics Infrastructure for Efficient AI-Based Processing -- Chapter 10. An Outlook on Power Electronics Reliability and Reliability Monitoring -- Chapter 11. Digital Twin Technology in Electronics -- Chapter 12. A Framework for Applying Data-driven AI/ML Models in Reliability. Chapter 13. Health monitoring fatigue properties of solder Interconnects in LED drivers -- Chapter 14. Compiling Hybrid Models for embedded architectures using TensorflowLite for Microcontrollers -- Chapter 15. Design support for reliable integrated circuits -- Chapter 16. Outlook: the future of reliability. This book describes the latest progress in reliability analysis of microelectronic products. The content grows out of an EU project, named Intelligent Reliability 4.0 - iRel40 (see www.irel40.eu ). Different industrial sectors and topics are covered, such as electronics in automotive, rail transport, lighting and personal appliances. Several case studies and examples are discussed, which will enable readers to assess and mitigate similar failure cases. More importantly, this book tries to present methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of electronic devices. Describes state-of-the-art methodologies for analyzing the reliability, failure, and degradation of electronic devices; Discusses how to correlate electronic processing and performance to reliability and lifetime; Provides an overview of simulation techniques and methodologies to predict lifetime and reliability of electronic devices. Electronic circuits. Electronic circuit design. 66119 Solid state physics. Electronic Circuits and Systems. Electronics Design and Verification. 66120 Electronic Devices. van Driel, Willem Dirk. editor. edt http://id.loc.gov/vocabulary/relators/edt 80399 Pressel, Klaus. editor. edt http://id.loc.gov/vocabulary/relators/edt 80400 Soyturk, Mujdat. editor. edt http://id.loc.gov/vocabulary/relators/edt 80401 SpringerLink (Online service) Springer Nature eBook Printed edition: 9783031593604 Printed edition: 9783031593628 Printed edition: 9783031593635 https://doi.org/10.1007/978-3-031-59361-1 ZDB-2-ENG ZDB-2-SXE 61522 61522