03724nam a22005775i 4500 978-4-431-56940-4 DE-He213 20251030112707.0 cr nn 008mamaa 240802s2024 ja | s |||| 0|eng d 9784431569404 978-4-431-56940-4 10.1007/978-4-431-56940-4 doi TA417.23 TGMT bicssc PDND bicssc TEC021000 bisacsh TGMT thema Tanaka, Nobuo. author. aut http://id.loc.gov/vocabulary/relators/aut 81823 Electron Nano-imaging [electronic resource] : Basics of Imaging and Diffraction for TEM and STEM / by Nobuo Tanaka. 2nd ed. 2024. Tokyo : Springer Japan : Imprint: Springer, 2024. XXX, 384 p. 142 illus., 13 illus. in color. online resource. text txt rdacontent computer c rdamedia online resource cr rdacarrier text file PDF rda Chapter 1 Seeing nanometer-sized world -- Chgapter 2 Structure and imaging of a transmission electron microscope (TEM) -- Chapter 3 Basic theories of TEM imaging -- Chapter 4 Resolution and image contrast of a transmission electron microscope (TEM) -- Chapter 5 What is high-resolution transmission electron microscopy ?. In this second edition, most chapters of the first edition, which published in 2017, have been revised and recent advancement of electron microscopy such as differential phase contrast (DPC) STEM, sparse-coding image processing and quantum electron microscopy have been supplemented with further details. This book explains the basis of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. The comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by various kinds of knowledge around electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today’s graduate students and professionals just starting their careers. Materials Microscopy. 69162 Materials Analysis. Imaging systems. 68001 Spectrum analysis. 69373 Nanoscience. 65329 Microscopy. 69164 Imaging Techniques. 68003 Characterization and Analytical Technique. 66416 Spectroscopy. 69375 Nanophysics. 67377 SpringerLink (Online service) Springer Nature eBook Printed edition: 9784431569398 Printed edition: 9784431569411 https://doi.org/10.1007/978-4-431-56940-4 ZDB-2-CMS ZDB-2-SXC 62192 62192