Machine Learning and Knowledge Discovery in Databases. Research Track and Demo Track
European Conference, ECML PKDD 2024, Vilnius, Lithuania, September 9–13, 2024, Proceedings, Part VIII
Bifet, Albert.
editor.
edt
http://id.loc.gov/vocabulary/relators/edt
Daniušis, Povilas.
editor.
edt
http://id.loc.gov/vocabulary/relators/edt
Davis, Jesse.
editor.
edt
http://id.loc.gov/vocabulary/relators/edt
Krilavičius, Tomas.
editor.
edt
http://id.loc.gov/vocabulary/relators/edt
Kull, Meelis.
editor.
edt
http://id.loc.gov/vocabulary/relators/edt
Ntoutsi, Eirini.
editor.
edt
http://id.loc.gov/vocabulary/relators/edt
Puolamäki, Kai.
editor.
edt
http://id.loc.gov/vocabulary/relators/edt
Žliobaitė, Indrė.
editor.
edt
http://id.loc.gov/vocabulary/relators/edt
SpringerLink (Online service)
text
sz
2024
1st ed. 2024.
monographic
eng
access
LVIII, 436 p. 145 illus., 131 illus. in color. online resource.
Chapter “Pattern or Artifact? Interactively Exploring Embedding Quality with TRACE” is available open access under a Creative Commons Attribution 4.0 International License via link.springer.com.
edited by Albert Bifet, Povilas Daniušis, Jesse Davis, Tomas Krilavičius, Meelis Kull, Eirini Ntoutsi, Kai Puolamäki, Indrė Žliobaitė.
Artificial intelligence
Computer engineering
Computer networks
Computers
Image processing
Digital techniques
Computer vision
Software engineering
Artificial Intelligence
Computer Engineering and Networks
Computing Milieux
Computer Imaging, Vision, Pattern Recognition and Graphics
Software Engineering
Q334-342
TA347.A78
Springer Nature eBook
Lecture Notes in Artificial Intelligence, 14948
9783031703713
https://doi.org/10.1007/978-3-031-70371-3
https://doi.org/10.1007/978-3-031-70371-3
240901
20251030112929.0
978-3-031-70371-3