<?xml version="1.0" encoding="UTF-8"?>
<record
    xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance"
    xsi:schemaLocation="http://www.loc.gov/MARC21/slim http://www.loc.gov/standards/marcxml/schema/MARC21slim.xsd"
    xmlns="http://www.loc.gov/MARC21/slim">

  <leader>03981nam a22006375i 4500</leader>
  <controlfield tag="001">978-3-031-64803-8</controlfield>
  <controlfield tag="003">DE-He213</controlfield>
  <controlfield tag="005">20251030113103.0</controlfield>
  <controlfield tag="007">cr nn 008mamaa</controlfield>
  <controlfield tag="008">240925s2024    sz |    s    |||| 0|eng d</controlfield>
  <datafield tag="020" ind1=" " ind2=" ">
    <subfield code="a">9783031648038</subfield>
    <subfield code="9">978-3-031-64803-8</subfield>
  </datafield>
  <datafield tag="024" ind1="7" ind2=" ">
    <subfield code="a">10.1007/978-3-031-64803-8</subfield>
    <subfield code="2">doi</subfield>
  </datafield>
  <datafield tag="050" ind1=" " ind2="4">
    <subfield code="a">QA76.76.O62</subfield>
  </datafield>
  <datafield tag="072" ind1=" " ind2="7">
    <subfield code="a">U</subfield>
    <subfield code="2">bicssc</subfield>
  </datafield>
  <datafield tag="072" ind1=" " ind2="7">
    <subfield code="a">COM051390</subfield>
    <subfield code="2">bisacsh</subfield>
  </datafield>
  <datafield tag="072" ind1=" " ind2="7">
    <subfield code="a">ULJ</subfield>
    <subfield code="2">thema</subfield>
  </datafield>
  <datafield tag="100" ind1="1" ind2=" ">
    <subfield code="a">Tamura, Yoshinobu.</subfield>
    <subfield code="e">author.</subfield>
    <subfield code="4">aut</subfield>
    <subfield code="4">http://id.loc.gov/vocabulary/relators/aut</subfield>
    <subfield code="9">84954</subfield>
  </datafield>
  <datafield tag="245" ind1="1" ind2="0">
    <subfield code="a">Applied OSS Reliability Assessment Modeling, AI and Tools</subfield>
    <subfield code="h">[electronic resource] :</subfield>
    <subfield code="b">Mathematics and AI for OSS Reliability Assessment /</subfield>
    <subfield code="c">by Yoshinobu Tamura, Shigeru Yamada.</subfield>
  </datafield>
  <datafield tag="250" ind1=" " ind2=" ">
    <subfield code="a">1st ed. 2024.</subfield>
  </datafield>
  <datafield tag="264" ind1=" " ind2="1">
    <subfield code="a">Cham :</subfield>
    <subfield code="b">Springer Nature Switzerland :</subfield>
    <subfield code="b">Imprint: Springer,</subfield>
    <subfield code="c">2024.</subfield>
  </datafield>
  <datafield tag="300" ind1=" " ind2=" ">
    <subfield code="a">XI, 188 p. 99 illus., 80 illus. in color.</subfield>
    <subfield code="b">online resource.</subfield>
  </datafield>
  <datafield tag="336" ind1=" " ind2=" ">
    <subfield code="a">text</subfield>
    <subfield code="b">txt</subfield>
    <subfield code="2">rdacontent</subfield>
  </datafield>
  <datafield tag="337" ind1=" " ind2=" ">
    <subfield code="a">computer</subfield>
    <subfield code="b">c</subfield>
    <subfield code="2">rdamedia</subfield>
  </datafield>
  <datafield tag="338" ind1=" " ind2=" ">
    <subfield code="a">online resource</subfield>
    <subfield code="b">cr</subfield>
    <subfield code="2">rdacarrier</subfield>
  </datafield>
  <datafield tag="347" ind1=" " ind2=" ">
    <subfield code="a">text file</subfield>
    <subfield code="b">PDF</subfield>
    <subfield code="2">rda</subfield>
  </datafield>
  <datafield tag="490" ind1="1" ind2=" ">
    <subfield code="a">Springer Series in Reliability Engineering,</subfield>
    <subfield code="x">2196-999X</subfield>
  </datafield>
  <datafield tag="505" ind1="0" ind2=" ">
    <subfield code="a">Open Source Software Reliability -- Stochastic Differential Equation Model for OSS Reliability Analysis -- Dimensional Stochastic Differential Equation Model for OSS Reliability Analysis -- Jump Diffusion Process Model for OSS Reliability Analysis -- Cyclically Two Dimensional Stochastic Differential Equation Modeling -- Cyclically Two Dimensional Jump Diffusion Process Modeling -- Three Dimensional Tool Based on Noisy Model -- Deep Learning Method Based on fault big data Analysis for OSS Reliability Assessment -- Deep Learning Approach for OSS Reliability Assessment Considering Wiener Process -- Deep Learning Approach for OSS Reliability Assessment Considering Jump Diffusion Process -- Performance Illustrations of the Developed Application Tool Based on Deep Learning -- Exercise.</subfield>
  </datafield>
  <datafield tag="520" ind1=" " ind2=" ">
    <subfield code="a">This textbook introduces the theory and application of open source software (OSS) reliability. The measurement and management of open source software are essential to produce and maintain quality and reliable systems while using open source software. This book describes the latest methods for the reliability assessment of open source software. It presents the state of the art of open source software reliability measurement and assessment based on stochastic modeling and deep learning approaches. It introduces several stochastic reliability analyses of OSS computing with application along with actual OSS project data. The book contains exercises to aid learning and is useful for graduate students and researchers.</subfield>
  </datafield>
  <datafield tag="650" ind1=" " ind2="0">
    <subfield code="a">Open source software.</subfield>
    <subfield code="9">9313</subfield>
  </datafield>
  <datafield tag="650" ind1=" " ind2="0">
    <subfield code="a">Artificial intelligence.</subfield>
    <subfield code="9">58441</subfield>
  </datafield>
  <datafield tag="650" ind1=" " ind2="0">
    <subfield code="a">Cooperating objects (Computer systems).</subfield>
    <subfield code="9">64303</subfield>
  </datafield>
  <datafield tag="650" ind1=" " ind2="0">
    <subfield code="a">Industrial engineering.</subfield>
  </datafield>
  <datafield tag="650" ind1=" " ind2="0">
    <subfield code="a">Production engineering.</subfield>
  </datafield>
  <datafield tag="650" ind1=" " ind2="0">
    <subfield code="a">Data protection.</subfield>
  </datafield>
  <datafield tag="650" ind1=" " ind2="0">
    <subfield code="a">Computers.</subfield>
    <subfield code="9">65793</subfield>
  </datafield>
  <datafield tag="650" ind1="1" ind2="4">
    <subfield code="a">Open Source.</subfield>
    <subfield code="9">66214</subfield>
  </datafield>
  <datafield tag="650" ind1="2" ind2="4">
    <subfield code="a">Artificial Intelligence.</subfield>
    <subfield code="9">58441</subfield>
  </datafield>
  <datafield tag="650" ind1="2" ind2="4">
    <subfield code="a">Cyber-Physical Systems.</subfield>
    <subfield code="9">65638</subfield>
  </datafield>
  <datafield tag="650" ind1="2" ind2="4">
    <subfield code="a">Industrial and Production Engineering.</subfield>
  </datafield>
  <datafield tag="650" ind1="2" ind2="4">
    <subfield code="a">Data and Information Security.</subfield>
    <subfield code="9">66492</subfield>
  </datafield>
  <datafield tag="650" ind1="2" ind2="4">
    <subfield code="a">Hardware Performance and Reliability.</subfield>
    <subfield code="9">71397</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
    <subfield code="a">Yamada, Shigeru.</subfield>
    <subfield code="e">author.</subfield>
    <subfield code="4">aut</subfield>
    <subfield code="4">http://id.loc.gov/vocabulary/relators/aut</subfield>
    <subfield code="9">84955</subfield>
  </datafield>
  <datafield tag="710" ind1="2" ind2=" ">
    <subfield code="a">SpringerLink (Online service)</subfield>
  </datafield>
  <datafield tag="773" ind1="0" ind2=" ">
    <subfield code="t">Springer Nature eBook</subfield>
  </datafield>
  <datafield tag="776" ind1="0" ind2="8">
    <subfield code="i">Printed edition:</subfield>
    <subfield code="z">9783031648021</subfield>
  </datafield>
  <datafield tag="776" ind1="0" ind2="8">
    <subfield code="i">Printed edition:</subfield>
    <subfield code="z">9783031648045</subfield>
  </datafield>
  <datafield tag="776" ind1="0" ind2="8">
    <subfield code="i">Printed edition:</subfield>
    <subfield code="z">9783031648052</subfield>
  </datafield>
  <datafield tag="830" ind1=" " ind2="0">
    <subfield code="a">Springer Series in Reliability Engineering,</subfield>
    <subfield code="x">2196-999X</subfield>
    <subfield code="9">71674</subfield>
  </datafield>
  <datafield tag="856" ind1="4" ind2="0">
    <subfield code="u">https://doi.org/10.1007/978-3-031-64803-8</subfield>
  </datafield>
  <datafield tag="912" ind1=" " ind2=" ">
    <subfield code="a">ZDB-2-ENG</subfield>
  </datafield>
  <datafield tag="912" ind1=" " ind2=" ">
    <subfield code="a">ZDB-2-SXE</subfield>
  </datafield>
  <datafield tag="999" ind1=" " ind2=" ">
    <subfield code="c">63682</subfield>
    <subfield code="d">63682</subfield>
  </datafield>
</record>
