Bernstein, Joseph B. creator aut Bensoussan, Alain A. aut Bender, Emmanuel aut text xxu Wiley 2024 |||| 1 monographic eng

electronic

electronic resource

access 400pp.; RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality & Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the 'physics of failure', combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditions Detailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and more New multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing. specialized Joseph B. Bernstein, Alain A. Bensoussan, Emmanuel Bender Quality & Reliability MEMS and Nanoelectronics Industrial Engineering / Quality Control Reliability; design-for-reliability; electrical engineering; deep-sub-micron FINFET; GaN; failure-mechanism; failure rate; reliability prediction; reliability physics; multiple mechanisms; burn-in; acceleration model; failure rate curve 9781394210961 https://doi.org/10.1002/9781394210961 https://onlinelibrary.wiley.com/action/showBook?doi=10.1002%2F9781394210961 https://onlinelibrary.wiley.com/cms/asset/cd7669be-250f-429e-b72b-1c823f99b7c9/9781394210961.cover.gif https://doi.org/10.1002/9781394210961 https://onlinelibrary.wiley.com/action/showBook?doi=10.1002%2F9781394210961 https://onlinelibrary.wiley.com/cms/asset/cd7669be-250f-429e-b72b-1c823f99b7c9/9781394210961.cover.gif 240216 20251030120307.0 10.1002/9781394210961