03505nam a22003974u 450000100220000000300060002200500170002800700150004500800410006002000300010102400310013104100080016210000370017024501300020725000060033726000160034326400160035930000120037533600260038733700260041333800360043934700210047534700080049652018100050465000330231465000360234765000520238365302410243570000370267670000330271377600360274685600640278285601020284685601420294899900170309010.1002/9781394210961Wiley20251030120307.0cr nn 008mam|a240216t2024||||xxu    fs|   |0|| 0|eng||  a9781394210961qelectronic7 a10.1002/97813942109612doi  aeng1 aBernstein, Joseph B.4aut99154910aReliability Prediction for Microelectronicsh[electronic resource]cJoseph B. Bernstein, Alain A. Bensoussan, Emmanuel Bender  a1  bWileyc2024 1bWileyc2024  a400pp.;  atextbtxt2rdacontent  acomputerbc2rdamedia  aonline resourcebcr2rdacarrier  atext file2rdaft  bPDF  aRELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality & Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the 'physics of failure', combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditions Detailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and more New multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing. 4aQuality & Reliability991550 4aMEMS and Nanoelectronics991127 4aIndustrial Engineering / Quality Control99145800aReliability; design-for-reliability; electrical engineering; deep-sub-micron FINFET; GaN; failure-mechanism; failure rate; reliability prediction; reliability physics; multiple mechanisms; burn-in; acceleration model; failure rate curve1 aBensoussan, Alain A.4aut9915511 aBender, Emmanuel4aut99155208iPrinted edition:z978139421093040uhttps://doi.org/10.1002/9781394210961aWiley Online Library40uhttps://onlinelibrary.wiley.com/action/showBook?doi=10.1002%2F9781394210961aWiley Online Library423Cover Imageuhttps://onlinelibrary.wiley.com/cms/asset/cd7669be-250f-429e-b72b-1c823f99b7c9/9781394210961.cover.gifaWiley Online Library  c66994d66994