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020 _a9783031503047
_9978-3-031-50304-7
024 7 _a10.1007/978-3-031-50304-7
_2doi
050 4 _aTA459-492
072 7 _aTGM
_2bicssc
072 7 _aTEC021030
_2bisacsh
072 7 _aTGM
_2thema
245 1 0 _aCharacterization of Minerals, Metals, and Materials 2024
_h[electronic resource] :
_bProcess–Structure–Property Relations and New Technologies /
_cedited by Zhiwei Peng, Mingming Zhang, Jian Li, Bowen Li, Sergio Neves Monteiro, Rajiv Soman, Jiann-Yang Hwang, Yunus Eren Kalay, Juan P. Escobedo-Diaz, John S. Carpenter, Andrew D. Brown, Shadia Ikhmayies.
250 _a1st ed. 2024.
264 1 _aCham :
_bSpringer Nature Switzerland :
_bImprint: Springer,
_c2024.
300 _aXXIV, 709 p. 370 illus., 295 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aThe Minerals, Metals & Materials Series,
_x2367-1696
520 _aThe collection focuses on the advancements of characterization of minerals, metals, and materials and the applications of characterization results on the processing of these materials. Advanced characterization methods, techniques, and new instruments are emphasized. Areas of interest include, but are not limited to: · Extraction and processing of various types of minerals, process-structure-property relationship of metal alloys, glasses, ceramics, polymers, composites, semiconductors, and carbon using functional and structural materials. · Novel methods and techniques for characterizing materials across a spectrum of systems and processes. · Characterization of mechanical, thermal, electrical, optical, dielectric, magnetic, physical, and other properties of materials. · Characterization of structural, morphological,and topographical natures of materials at micro- and nano- scales. · Characterization of extraction and processing including process development and analysis. · Advances in instrument developments for microstructure analysis and performance evaluation of materials, such as computer tomography (CT), X-ray and neutron diffraction, electron microscopy (SEM, FIB, TEM), and spectroscopy (EDS, WDS, EBSD) techniques. · 2D and 3D modelling for materials characterization.
650 0 _aMetals.
650 0 _aMaterials
_xAnalysis.
650 0 _aMaterials
_xFatigue.
_967940
650 0 _aMineralogy.
_966552
650 0 _aMaterials science.
_965330
650 1 4 _aMetals and Alloys.
650 2 4 _aMaterials Characterization Technique.
650 2 4 _aMaterials Fatigue.
_967941
650 2 4 _aMineralogy.
_966552
650 2 4 _aMaterials Science.
_965330
700 1 _aPeng, Zhiwei.
_eeditor.
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_4http://id.loc.gov/vocabulary/relators/edt
_970469
700 1 _aZhang, Mingming.
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_4http://id.loc.gov/vocabulary/relators/edt
_970470
700 1 _aLi, Jian.
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_4http://id.loc.gov/vocabulary/relators/edt
_970471
700 1 _aLi, Bowen.
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_1https://orcid.org/0000-0002-6331-1629
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700 1 _aMonteiro, Sergio Neves.
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_4http://id.loc.gov/vocabulary/relators/edt
_970473
700 1 _aSoman, Rajiv.
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_4http://id.loc.gov/vocabulary/relators/edt
_970474
700 1 _aHwang, Jiann-Yang.
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_4http://id.loc.gov/vocabulary/relators/edt
_970475
700 1 _aKalay, Yunus Eren.
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_4http://id.loc.gov/vocabulary/relators/edt
_970476
700 1 _aEscobedo-Diaz, Juan P.
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_4http://id.loc.gov/vocabulary/relators/edt
_970477
700 1 _aCarpenter, John S.
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_4http://id.loc.gov/vocabulary/relators/edt
_970478
700 1 _aBrown, Andrew D.
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_4http://id.loc.gov/vocabulary/relators/edt
_970479
700 1 _aIkhmayies, Shadia.
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_4http://id.loc.gov/vocabulary/relators/edt
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710 2 _aSpringerLink (Online service)
773 0 _tSpringer Nature eBook
776 0 8 _iPrinted edition:
_z9783031503030
776 0 8 _iPrinted edition:
_z9783031503054
776 0 8 _iPrinted edition:
_z9783031503061
830 0 _aThe Minerals, Metals & Materials Series,
_x2367-1696
856 4 0 _uhttps://doi.org/10.1007/978-3-031-50304-7
912 _aZDB-2-CMS
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