000 04323nam a22006375i 4500
001 978-3-031-44233-9
003 DE-He213
005 20251030111419.0
007 cr nn 008mamaa
008 240206s2024 sz | s |||| 0|eng d
020 _a9783031442339
_9978-3-031-44233-9
024 7 _a10.1007/978-3-031-44233-9
_2doi
050 4 _aT50
050 4 _aQC100.5-.8
072 7 _aPDDM
_2bicssc
072 7 _aTEC022000
_2bisacsh
072 7 _aPDD
_2thema
100 1 _aXia, Fangzhou.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_970708
245 1 0 _aActive Probe Atomic Force Microscopy
_h[electronic resource] :
_bA Practical Guide on Precision Instrumentation /
_cby Fangzhou Xia, Ivo W. Rangelow, Kamal Youcef-Toumi.
250 _a1st ed. 2024.
264 1 _aCham :
_bSpringer International Publishing :
_bImprint: Springer,
_c2024.
300 _aXXIV, 366 p. 138 illus., 125 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _aIntroduction -- Active Probe Design and Fabrication -- Advanced Applications of Active Probes -- Atomic Force Microscope Designs -- AFM System using Active Probe -- A Low-cost AFM Design for Engineering Education -- Appendix.
520 _aFrom a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatronic system topics are covered including mechanics, sensors, actuators, transmission design, system identification, signal processing, dynamic system modeling, controller. With a solid theoretical foundation, practical examples are provided for AFM subsystem level design on nano-positioning system, cantilever probe, control system and system integration. This book emphasizes novel development of active cantilever probes with embedded transducers, which enables new AFM capabilities for advanced applications. Full design details of a low-cost educational AFM and a Scale Model Interactive Learning Extended Reality (SMILER) toolkit are provided, which helps instructors to make use of this book for curriculum development. This book aims to empower AFM users with deeper understanding of theinstrument to extend AFM functionalities for advanced state-of-the-art research studies. Going beyond AFM, materials presented in this book are widely applicable to precision mechatronic system design covered in many upper-level graduate courses in mechanical and electrical engineering to cultivate next generation instrumentalists. Presents the instrument design details of atomic force microscopy with focus on active cantilever probes; Includes examples and exercises to boost understanding of AFM subsystem design, fabrication and integration; Imparts a hands-on curriculum for precision mechatronics and instrumentation with AFM and digital twin simulators.
650 0 _aMeasurement.
_967386
650 0 _aMeasuring instruments.
_967387
650 0 _aElectronics.
_965899
650 0 _aMechatronics.
_968795
650 0 _aSpectrum analysis.
_969373
650 0 _aMicrotechnology.
_965900
650 0 _aMicroelectromechanical systems.
_965901
650 1 4 _aMeasurement Science and Instrumentation.
_967389
650 2 4 _aElectronics and Microelectronics, Instrumentation.
_965902
650 2 4 _aMechatronics.
_968795
650 2 4 _aSpectroscopy.
_969375
650 2 4 _aMicrosystems and MEMS.
_965903
700 1 _aRangelow, Ivo W.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_970709
700 1 _aYoucef-Toumi, Kamal.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_970710
710 2 _aSpringerLink (Online service)
773 0 _tSpringer Nature eBook
776 0 8 _iPrinted edition:
_z9783031442322
776 0 8 _iPrinted edition:
_z9783031442346
776 0 8 _iPrinted edition:
_z9783031442353
856 4 0 _uhttps://doi.org/10.1007/978-3-031-44233-9
912 _aZDB-2-PHA
912 _aZDB-2-SXP
999 _c57522
_d57522