000 04574nam a22005655i 4500
001 978-3-031-48847-4
003 DE-He213
005 20251030112255.0
007 cr nn 008mamaa
008 240603s2024 sz | s |||| 0|eng d
020 _a9783031488474
_9978-3-031-48847-4
024 7 _a10.1007/978-3-031-48847-4
_2doi
050 4 _aQC610.9-611.8
072 7 _aTJFD5
_2bicssc
072 7 _aSCI077000
_2bisacsh
072 7 _aTJFD
_2thema
100 1 _aOcaya, Richard.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_978147
245 1 0 _aExtraction of Semiconductor Diode Parameters
_h[electronic resource] :
_bA Comparative Review of Methods and Materials /
_cby Richard Ocaya.
250 _a1st ed. 2024.
264 1 _aCham :
_bSpringer Nature Switzerland :
_bImprint: Springer,
_c2024.
300 _aXIX, 174 p. 86 illus., 62 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _aDetermining p-n Junction Band Gap -- Review of Metal-Semiconductor Junctions -- Contemporary Parameter Extraction Methods -- Transient Methods -- New Parameter Extraction Techniques -- p-n Diode Parameter Extraction -- Novel Unified Method -- Artifical Intelligence Parameter Extraction Methods.
520 _aThis book presents a comprehensive treatise on the extraction of semiconductor diode parameters using various methods. Its focus is on metal-semiconductor, metal-insulator-semiconductor, and p-n junction diodes, covering a wide range of metals and semiconductors, including elemental, compound, organic, and nanostructured materials. By bringing together these methods in one place, this book provides a much-needed standardized point of reference for the field. The methods used for device characterization have spread widely but not yet critically compared and contrasted. This book aims to bridge this gap by offering a comparative review of the methods and providing the most accurate information on current developments. The result is a valuable resource for researchers and practitioners who seek to optimize their use of semiconductor diodes in their work. With its thorough coverage and critical analysis, this book fills a large void in the field of semiconductor device characterization. It is an essential reference for anyone interested in the extraction of semiconductor diode parameters using a variety of methods. "Extraction of Semiconductor Diode Parameters: A Comparative Review of Methods and Materials" is an invaluable resource for anyone in the field. The book brilliantly fulfills its mission to encapsulate the latest developments in semiconductor diodes, providing comprehensive coverage of various materials and crucial parameters. Its comparative analysis of extraction methods, attention to series resistance, and exploration of emerging 2D materials make it a standout in the literature. Moreover, the book's dedication to addressing the impact of artificial intelligence is commendable. As a testament to the author's commitment to empowering researchers and engineers, this book is a must-have companion for those seeking to unlock the full potential of semiconductor devices, making it an indispensable reference in this rapidly evolving field. Prof. Yakuphanoglu, Department of Physics, Faculty of Science, Firat University, Elazig, Turkey Prof. Kwadwo Mensah - Darkwa, Department of Materials Engineering, Faculty of Mechanical and Chemical Engineering, College of Engineering, Kwame Nkrumah University of Science and Technology, Kumasi - Ghana.
650 0 _aSemiconductors.
_969883
650 0 _aSolid state physics.
650 0 _aOptoelectronic devices.
650 0 _aOptics.
_966607
650 0 _aCondensed matter.
_966773
650 1 4 _aSemiconductors.
_969883
650 2 4 _aElectronic Devices.
650 2 4 _aOptoelectronic Devices.
650 2 4 _aOptics and Photonics.
_967319
650 2 4 _aCondensed Matter.
_966773
710 2 _aSpringerLink (Online service)
773 0 _tSpringer Nature eBook
776 0 8 _iPrinted edition:
_z9783031488467
776 0 8 _iPrinted edition:
_z9783031488481
776 0 8 _iPrinted edition:
_z9783031488498
856 4 0 _uhttps://doi.org/10.1007/978-3-031-48847-4
912 _aZDB-2-PHA
912 _aZDB-2-SXP
999 _c60469
_d60469