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020 _a9784431569404
_9978-4-431-56940-4
024 7 _a10.1007/978-4-431-56940-4
_2doi
050 4 _aTA417.23
072 7 _aTGMT
_2bicssc
072 7 _aPDND
_2bicssc
072 7 _aTEC021000
_2bisacsh
072 7 _aTGMT
_2thema
100 1 _aTanaka, Nobuo.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_981823
245 1 0 _aElectron Nano-imaging
_h[electronic resource] :
_bBasics of Imaging and Diffraction for TEM and STEM /
_cby Nobuo Tanaka.
250 _a2nd ed. 2024.
264 1 _aTokyo :
_bSpringer Japan :
_bImprint: Springer,
_c2024.
300 _aXXX, 384 p. 142 illus., 13 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _aChapter 1 Seeing nanometer-sized world -- Chgapter 2 Structure and imaging of a transmission electron microscope (TEM) -- Chapter 3 Basic theories of TEM imaging -- Chapter 4 Resolution and image contrast of a transmission electron microscope (TEM) -- Chapter 5 What is high-resolution transmission electron microscopy ?.
520 _aIn this second edition, most chapters of the first edition, which published in 2017, have been revised and recent advancement of electron microscopy such as differential phase contrast (DPC) STEM, sparse-coding image processing and quantum electron microscopy have been supplemented with further details. This book explains the basis of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. The comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by various kinds of knowledge around electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today’s graduate students and professionals just starting their careers.
650 0 _aMaterials
_xMicroscopy.
_969162
650 0 _aMaterials
_xAnalysis.
650 0 _aImaging systems.
_968001
650 0 _aSpectrum analysis.
_969373
650 0 _aNanoscience.
_965329
650 1 4 _aMicroscopy.
_969164
650 2 4 _aImaging Techniques.
_968003
650 2 4 _aCharacterization and Analytical Technique.
_966416
650 2 4 _aSpectroscopy.
_969375
650 2 4 _aNanophysics.
_967377
710 2 _aSpringerLink (Online service)
773 0 _tSpringer Nature eBook
776 0 8 _iPrinted edition:
_z9784431569398
776 0 8 _iPrinted edition:
_z9784431569411
856 4 0 _uhttps://doi.org/10.1007/978-4-431-56940-4
912 _aZDB-2-CMS
912 _aZDB-2-SXC
999 _c62192
_d62192