000			03595cam a2200541M 4500
001			9781003258339
003			FlBoTFG
005			20251030122232.0
006			m o d
007			cr |n|||||||||
008			231227s2023 xx o 0|| 0 eng d
040			_aOCoLC-P _beng _cOCoLC-P
020			_a9781000997910 _q(electronic bk.)
020			_a100099791X _q(electronic bk.)
020			_a9781003258339 _q(electronic bk.)
020			_a1003258336 _q(electronic bk.)
020			_a9781000997941 _q(electronic bk. : EPUB)
020			_a1000997944 _q(electronic bk. : EPUB)
020			_z1032192488
020			_z9781032192482
020			_z1032189428
020			_z9781032189420
024	7		_a10.1201/9781003258339 _2doi
035			_a(OCoLC)1415967806
035			_a(OCoLC-P)1415967806
050		4	_aTA418.5
072		7	_aSCI _x078000 _2bisacsh
072		7	_aTEC _x009010 _2bisacsh
072		7	_aSCI _x077000 _2bisacsh
072		7	_aPNFS _2bicssc
100	1		_aEngler, Olaf. _993195
245	1	0	_aINTRODUCTION TO TEXTURE ANALYSIS _h[electronic resource] : _bmacrotexture, microtexture, and orientation mapping.
250			_a3rd ed.
260			_a[S.l.] : _bCRC PRESS, _c2023.
300			_a1 online resource
520			_aReflecting emerging methods and the evolution of the field, Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping keeps mathematics to a minimum in covering both traditional macrotexture analysis and more advanced electron-microscopy-based microtexture analysis. The authors integrate the two techniques and address the subsequent need for a more detailed explanation of philosophy, practice, and analysis associated with texture analysis. The book illustrates approaches to orientation measurement and interpretation and elucidates the fundamental principles on which measurements are based. Thoroughly updated, this Third Edition of a best-seller is a rare introductory-level guide to texture analysis. Discusses terminology associated with orientations, texture, and their representation, as well as the diffraction of radiation, a phenomenon that is the basis for almost all texture analysis Covers data acquisition, as well as representation and evaluation related to the well-established methods of macrotexture analysis Updated to include experimental details of the latest transmission or scanning electron microscope-based techniques for microstructure analysis, including electron backscatter diffraction (EBSD) Describes how microtexture data are evaluated and represented and emphasizes the advances in orientation microscopy and mapping, and advanced issues concerning crystallographic aspects of interfaces and connectivity Offers new and innovative grain boundary descriptions and examples This book is an ideal tool to help readers in the materials sciences develop a working understanding of the practice and applications of texture.
588			_aOCLC-licensed vendor bibliographic record.
650		0	_aMaterials _xTexture. _993196
650		0	_aMaterials _xAnalysis.
650		7	_aSCIENCE / Spectroscopy & Spectrum Analysis _2bisacsh _993197
650		7	_aTECHNOLOGY / Engineering / Chemical & Biochemical _2bisacsh _963924
650		7	_aSCIENCE / Solid State Physics _2bisacsh _993198
856	4	0	_3Taylor & Francis _uhttps://www.taylorfrancis.com/books/9781003258339
856	4	2	_3OCLC metadata license agreement _uhttp://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
942			_cE-Books
999			_c67487 _d67487