000 03143nam a22006257i 4500
001 9781003309635
003 FlBoTFG
005 20251030122235.0
006 m o d
007 cr cnu---unuuu
008 221010s2022 flu ob 001 0 eng d
040 _aOCoLC-P
_beng
_erda
_epn
_cOCoLC-P
020 _a9781003309635
_q(electronic bk.)
020 _a1003309631
_q(electronic bk.)
020 _a9781000792829
_q(electronic bk. : EPUB)
020 _a100079282X
_q(electronic bk. : EPUB)
020 _a9781000796483
_q(electronic bk. : PDF)
020 _a1000796485
_q(electronic bk. : PDF)
020 _z9781032314136
020 _z1032314133
020 _z9781032314174
020 _z1032314176
020 _z1003309631
024 7 _a10.1201/9781003309635
_2doi
035 _a(OCoLC)1347185525
035 _a(OCoLC-P)1347185525
050 4 _aTA169
_b.N3526 2022eb
072 7 _aBUS
_x053000
_2bisacsh
072 7 _aMAT
_x029000
_2bisacsh
072 7 _aMAT
_x029010
_2bisacsh
072 7 _aPBT
_2bicssc
100 1 _aNair, N. Unnikrishnan,
_d1945-
_eauthor.
_993543
245 1 0 _aReliability modelling with information measures /
_cN. Unnikrishnan Nair, S. M. Sunoj, G. Rajesh, Department of Statistics, Cochin University of Science and Technology, Kerala, India.
250 _aFirst edition.
264 1 _aBoca Raton :
_bCRC Press,
_c2022.
300 _a1 online resource (1 volume)
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
520 _a"This is the first book on this topic and has no competing works in literature. so that there may not be any market competition. The interface between Information Theory and Reliability is only two decades old and continues to be a fertile area for study and research. The topic has attracted several researchers from statistics, reliability and survival analysis, industry, communications and engineering. There is no single source for finding the literature spread over several journals and the book meets this demand. This book can be used as textbook for specialization in statistics and communication courses. It serves also as a self-contained reference volume"--
_cProvided by publisher.
588 _aOCLC-licensed vendor bibliographic record.
650 0 _aReliability (Engineering)
_xStatistical methods.
_993544
650 0 _aService life (Engineering)
_xMeasurement.
_993545
650 0 _aFault location (Engineering)
_993546
650 7 _aBUSINESS & ECONOMICS / Quality Control
_2bisacsh
_993547
650 7 _aMATHEMATICS / Probability & Statistics / General
_2bisacsh
_963965
650 7 _aMATHEMATICS / Probability & Statistics / Bayesian Analysis
_2bisacsh
_993548
700 1 _aSunoj, S. M.,
_d1972-
_eauthor.
_993549
700 1 _aRajesh, G.,
_d1971-
_eauthor.
_993550
856 4 0 _3Taylor & Francis
_uhttps://www.taylorfrancis.com/books/9781003309635
856 4 2 _3OCLC metadata license agreement
_uhttp://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
942 _cE-Books
999 _c67569
_d67569